Convergent Beam Electron Diffraction of Ordered L10 Nanoparticles
نویسندگان
چکیده
منابع مشابه
Convergent beam electron diffraction
In convergent-beam electron diffraction (CBED) a highly convergent electron beam is focussed on to a small (~< 50 nm) area of the sample. Instead of the diffraction spots that are obtained in the back focal plane of the objective lens with parallel illumination in conventional selected-area electron diffraction, CBED produces discs of intensity. The point group can be determined uniquely from t...
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The development of new materials requires an understanding of their mode of growth and the nature of defects, interfaces and strains thereby incorporated. This paper shows how convergent beam electron diffraction (CBED) and large angle CBED (LACBED) can be used to analyse such problems. It is shown how CBED and LACBED can give two-beam rocking curves, which can be used to profile plane rotation...
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The electron density difference map, ∆ρ(r)= ρ(r)Cryst ρ(r)IAM, here defined as the difference between the electron density of a crystal, ρ(r)Cryst, and that of the equivalent independent atom model (IAM), ρ(r)IAM, represents one of the quantum mechanical characteristics central for developing fundamental understanding of materials. Convergent beam electron diffraction (CBED) experiments perform...
متن کاملRecent Advances in Quantitative Convergent Beam Electron Diffraction
Two recent advances in quantitative convergent beam electron diffraction (CBED) developed at the University of Bristol are described in this paper. The first is a new scanning technique in which the diffracted intensities in the resulting pattern are integrated through the Bragg condition, equivalent to precessing the sample around a stationary beam. Many more reflections are excited than in a ...
متن کاملPractical phase identification by convergent beam electron diffraction.
The purpose of this article is to present a practical guide to the identification of phases in the analytical electron microscope with the aid of convergent beam electron diffraction. There is included a step-by-step approach to phase analysis, from the possible choices of the form of the specimen through how to explore reciprocal space in order to perform a full phase identification, either by...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2005
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927605506901